The International Electrotechnical Commission (IEC) has adopted a nano-scale measurement technology developed by domestic researchers as an international standard for the micro electro mechanical system.

The Education, Science and Technology Ministry on Monday said that a research team led by Lee Hak-joo at the Korea Institute of Machinery and Materials has developed a strip bending test, a nano-scale measurement technology.

The adoption is expected to enhance the nation's competitiveness in the global nano-scale measurement market of 13-and-a-half trillion won.

The strip bending test enables easy and accurate measurement of tensile properties of thin films used in micro or nano structures, contributing to boosting the reliability of micro electromechanical products.